METHOD FOR SELECTING STANDARDS OUT OF ASSEMBLY OF SINGLE-TYPE INSTRUMENTATION Russian patent published in 1998 - IPC

FIELD: metrology. SUBSTANCE: method involves application of equal measured quantity to input of analyzed assembly of single-type instrumentation or its picking off assembly output, determination of actual error and accuracy class of instrumentation under analysis because there is no cause of in-service simultaneous drift of metrological characteristics of assembly, and calculation of statistical characteristics of standard selection quality using statistical characteristics showing how close are instrumentation readings to known statistical confidence level in metrologically similar sub- group of analyzed assembly as far as its statistical characteristics are concerned; if actual error, accuracy class, and statistical characteristics of standard selection quality comply with specified requirements, decision is made to use instrumentation of metrologically similar sub-group as standards. EFFECT: improved efficiency of standard selection due to reduced consumption of material, labor, and time. 1 dwg