FIELD: testing equipment for computer engineering and data transmission systems. SUBSTANCE: device has reference oscillator, input unit, first and second vernier units, gate, main, first and second vernier counters, flip-flop, sectioned delay line with n-1 outputs, registration and control unit. Goal of invention is achieved by use of additional reference signals, which are shifted with respect to one another and by introduced calibration mode for calculation of corrections for additional signals. EFFECT: increased speed and precision. 2 cl, 8 dwg
