FIELD: accelerator technology.
SUBSTANCE: inventions group relates to accelerator technology field. A method for determining a sample crystal structure destruction degree is based on recording secondary ionizing radiation at different angles of the sample and a semiconductor detector rotation, determining type of each recorded particle via pulse front, and also determining the sample destruction degree via the amorphization parameter.
EFFECT: invention determines degree of destruction of crystal structure of the sample, which has at least one flat surface, during the sample irradiation with accelerated particles without vacuum cycle disturbance.
8 cl, 7 dwg, 6 tbl
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