FIELD: study of physical and chemical properties of materials with use of diffraction of X-rays in crystals cemented together in one structure. SUBSTANCE: crystals are brought into reflecting position in sequence by turn of structure about axis of diffractometer and difference of angles with which maxima of reflection of monochromatic X-ray radiation from each crystal is observed is measured. Then structure is turned through 180 deg in own plane about normal to reflecting surface of any crystal and second difference of angles of maxima of reflections. After first turn through 180 deg and measurement of difference of reflection angles structure is turned additionally in own plane through unspecified but known angle Δα. Difference of reflection angles is measured, structure is turned through 180 deg in own plane and difference of reflection angles is measured again. Disorientation angle is computed by measured values. EFFECT: increased accuracy of determination of disorientation angle between crystals. 2 dwg, 1 tbl
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Authors
Dates
1999-10-10—Published
1997-10-07—Filed