METHOD FOR MEASURING DECREMENT OF X-RAY REFRACTION COEFFICIENT Russian patent published in 2004 - IPC

Abstract RU 2240541 C1

FIELD: physics.

SUBSTANCE: method includes use of formula δ=(ω₂-ω₁)Ψ/2, where ω₂ and ω₁ are respectively positive and negative angle of mounting of sample relatively to falling radiation, at which a peak of intensiveness of x-ray radiation is observed, Ψ - angle, at which detection is performed relatively to falling radiation.

EFFECT: higher precision.

4 dwg

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RU 2 240 541 C1

Authors

Pirshin I.V.

Tur'Janskij A.G.

Dates

2004-11-20—Published

2003-07-24—Filed