DEVICE MEASURING PARAMETERS OF PHYSICAL FIELDS AND MEDIA Russian patent published in 2000 - IPC

FIELD: measurement technology. SUBSTANCE: device measuring parameters of physical fields and media has multilayer set of flat materials that includes dielectric and conducting layers and fixing unit. At least one dielectric layer has holes in the form of grid or is perforated and one conducting layer as minimum is solid. Dielectric and conducting layers alternate. At least one conducting layer with holes and one solid layer of multilayer set of flat materials is connected to fixing unit. Holes of grid or perforation has size of 0.05 to 5.0 mm. EFFECT: widened range of simultaneous measurement of several parameters of physical fields and media, expanded technological capabilities and reduced expenses for manufacture of device. 1 cl, 1 dwg