WIDE-RANGE BED TO TEST PLATFORM-FREE INERTIAL MEASURING UNITS Russian patent published in 2001 - IPC

FIELD: measurement technology. SUBSTANCE: invention specifically refers to bed testing characteristics of inertial meters which incorporate micromechanical vibration gyroscopes-accelerometers. Given wide-range bed includes rotary platform for attachment of tested meter and for feed of power to it via ring collector, personal computer whose slots carry integration circuit with elements of control over testing characteristics of platform and with transmitters of controlled parameters of tested meters. Platform carries air cooler, thermoelectric module with microvibration table and universal thermal chamber placed in sequence along its spin axis. Air cooler comes in the form of case of cooler housing fan and perforated chamber installed in sequence along axis perpendicular to spin axis of platform and mounted on platform with the aid of gimbal suspension and two supports. Microvibration table is embraced on three sides by internal surface of thermoelectric module and is attached together with it to case of air cooler via electric insulation spacer. External surface of thermoelectric module is put tightly in quadrangle hole of case of universal thermal chamber produced from heat insulation material and forming useful space to accommodate tested meter and transmitters of controlled parameters together with fourth side of microvibration table. Holes for accommodation of electric wires of resistance coupling of tested meter, microvibration table, thermoelectric module and transmitters of controlled parameters to integration circuit built in slots of personal computer are made in electric insulation spacer and case of universal thermal chamber. EFFECT: widened functional capabilities of test bed thanks to guarantee for dynamic and thermal tests of microminiaturized devices in wide range with simultaneous provision for authenticity of reproduced operational conditions in process of testing and simplified processing of measurement information on state of tested device. 1 cl, 3 dwg