FIELD: physics of thin-film interactions. SUBSTANCE: method involves measurement of source parameters determining physical and chemical properties of working agent placed in space under investigation before its exposure to microlepton radiation followed by its exposure to microlepton radiation for 10-15 min, photography of microlepton cluster structures, recording of changes in parameters, as well as recording of parameters determining physical and chemical properties of working agent with respect to magnitude and polarity of microlepton radiation in the course or its exposure to the latter or else measurement of viscosity and ionic conductivity of working agent. Microlepton radiation recorder has microlepton radiation generator, working agent placed in space under investigation, sensing element, viscosimeter and/or ionic conductivity meter, and power unit connected to sensing element and to meter. EFFECT: improved validity of recorded data. 11 cl, 6 dwg
