METHOD INTERFERENCE MEASUREMENT OF SHAPE OF OPTICAL PART SURFACE Russian patent published in 2001 - IPC

Abstract RU 2166730 C2

FIELD: interference measurements; determination of coordinates of interference bands on photographs of interferograms. SUBSTANCE: method includes recording in interference pattern by photographic method on transparent carrier, illumination of recorder interferogram within interval of angles from β to α+β, where α - is angle of diffuse light scattering by interferogram, β is aperture angle of optical system; method includes also analysis of light picture which consists in illumination of interferogram within interval of angle from β to α+β by red light; interferogram is additionally illuminated by blue light at optical axis of analyzing object. EFFECT: extended functional capabilities of method of observation of interference bands in diffuse scattering. 2 cl, 1 dwg

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RU 2 166 730 C2

Authors

Noskov M.F.

Dates

2001-05-10Published

1998-10-09Filed