FIELD: nuclear engineering; flaw detection of various materials including zirconium or its alloys. SUBSTANCE: method involves recording of secondary radiation excited in coating layer and using these data to graphically determine layer thickness by means of standard. 22Na. is used as positron source. Spectrum within which coincidences of annihilation gamma quanta are distributed as function of their scattering angle is recorded and then spectrum parameter form is calculated as ratio of area in spectrum maximum to common area of spectrum is calculated. EFFECT: enhanced precision of determining barrier coating thickness. 3 cl, 2 dwg
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Authors
Dates
2002-04-10—Published
1999-12-14—Filed