WAY DETERMINING PARAMETERS OF TRANSIENT PROCESS Russian patent published in 2002 - IPC

FIELD: measurement technology, computation of parameters of transient process. SUBSTANCE: way determining parameters of transient process comprising sums of constant, changing linearly and growing exponential components consists in measurement of four momentary values of transient process at time moments t₁,2t₁,3t₁ и 4t₁ after start of transient process and in computation of constant component, tangent of linearly changing component, steady-state value and time constant of exponentially growing component of transient process by formulas given in description of invention. EFFECT: increased accuracy and reduced time of determination of parameters of transient process. 2 dwg