PROCEDURE MEASURING RELATIVE DEFORMATION OF STRUCTURES WHILE RESISTANCE STRAIN GAUGES ARE CONNECTED TO TENSOMETER SYSTEM Russian patent published in 2003 - IPC

Abstract RU 2196296 C2

FIELD: measurement technology, experimental study of stressed-deformed state of structures under normal temperature. SUBSTANCE: cables of resistance strain gauges according to procedure are connected to connectors of switch of measurement system in four-wire circuit, deviations of resistance of resistance strain gauges from resistance value of reference resistor of measuring device are measured, metrological test of system is conducted, conversion factor is found and resistance value of reference resistor is measured. Cables of resistance strain gauges are connected to resistance strain gauges in two-wire circuit, resistance of connecting wires is measured, value of resistance of reference resistor equal to sum of values of nominal resistance of resistance strain gauge and resistance of connecting wires from resistance strain gauge to switch is established. Value of relative deformation is found by measured values at each stage of loading of structure. EFFECT: decreased expenses for manufacture of measuring system, raised accuracy of measuring system. 1 dwg

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RU 2 196 296 C2

Authors

Zubov E.G.

Il'In Ju.S.

Lebedeva A.I.

Dates

2003-01-10Published

2000-01-28Filed