METHOD OF MEASURING PARAMETERS OF SHAFT KEYWAY Russian patent published in 2003 - IPC

Abstract RU 2205364 C1

FIELD: measurement technology. SUBSTANCE: shaft 1 is located by its cylindrical surface in vee block 4 providing contact of sensitive contact tip 6 with said surface. Shaft 1 is turned to provide getting of sensitive contact tip 6 into keyway to be checked and its contact with bottom of keyway. Then reciprocating rotation is imparted to shaft 1 to provide perpendicularity of axis of reading unit 5 relative to bottom of keyway under checking and first reading is recorded which is depth of keyway. By turning and shifting rod 7 with feeler gauge, in turn touching of ball-shaped side surface 9 of feeler gauge with side surfaces 11 and 12 of keyway is provided and primary readings of indicator 10 are recorded. By turning and shifting rod 7, centering of ball-shaped side surface 9 in vee block 4 is provided, and initial reading of indicator 10 is recorded. Deviation from symmetry is determined by said primary and initial readings of indicator 10, and width of keyway under checking is determined with due account of diameter of ball-shaped side surface 9. Then shaft 1 is re-installed in vee block 4 with provision if contact of sensitive contact tip 6 with bottom of keyway in its end, and shaft 1 is again reciprocally rotated to provide perpendicularity of axis of reading unit 5 relative to bottom of keyway and second reading of unit 5 is recorded and deviation from parallelism of keyway bottom relative to axis of cylindrical surface is determined by difference in first and second readings of said unit. Rod 7 with feeler gauge is turned and shifted to provide touching of ball-shaped surface 9 of feeler gauge with side surface 11 of keyway under checking and secondary reading of indicator 10 is recorded. Size of skewness of keyway under checking is found by difference between secondary and primary readings of indicator 10 obtained at contact of ball-shaped side surface 9 with one and the same side surface of keyway. EFFECT: increased capability, improved accuracy of measurements. 2 dwg

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RU 2 205 364 C1

Authors

Arkharov A.P.

Dates

2003-05-27Published

2002-06-11Filed