PROCESS OF PREPARATION OF SPECIMENS TO EXAMINE STRUCTURAL GEOMETRIC PARAMETERS OF OPAQUE MATERIALS Russian patent published in 2003 - IPC

FIELD: diffraction investigations. SUBSTANCE: process of preparation of specimens to examine structural geometric parameters of opaque materials by diffraction method consists in fabrication of specimen of surface of examined material on transparent base. Surface of examined material is prepared by electrophotographic method of generation of image on pantograph with its subsequent fixation by thermal method. Surface of examined textile material together with flat material superimposed on its opposite side and absorbing light of source used for copying in region of spectral sensitivity of semiconductor layer of pantograph is copied. EFFECT: shortened time of preparation of specimen of surface of examined material with preservation of quality of obtained specimen. 4 dwg