FIELD: measurement technology, test of non-electric values with use of capacitor pickups which capacitance varies depending on measured values by nonlinear law. SUBSTANCE: proposed facility includes two oscillators, microcontroller and digital indicator. Outputs of oscillators are connected to counting inputs of correspondingly first and second counters of microcontroller, one lead of input- output port of microcontroller is connected to enable generation inputs of both oscillators. Digital indicator is coupled to one input-output port of microcontroller. Capacitor pickup which capacitance Cx should be measured is placed in time-setting circuit of first oscillator, capacitor of reference capacitance C is placed in time-setting circuit of second oscillator. EFFECT: widened functional potential and increased sensitivity of facility. 1 dwg
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Authors
Dates
2003-10-20—Published
2001-12-13—Filed