FIELD: selection of gems. SUBSTANCE: device has scanning platform not shown in drawing that includes window 10 on which diamond or precious stone 14 is placed. Diamond or precious stone, which can be cut precious stone, is illuminated by two light-emitting diodes 102, 106, which carry means 110 and 112 of scatterer. Enlargement of scanning system is set at relatively low level, image of entire or larger part of at least one facet of diamond is displayed on video monitor 40. With increase of enlargement level light-emitting diodes 102, 106 switch off and central light-emitting diode 104 switches on in order to illuminate diamond with direct radiation. Position of diamond 14 is adjusted till condition of backward reflection is fulfilled which enables marks on surface of diamond or precious stone to be examined. EFFECT: capability to check quality of precious stones under normal conditions in closed room. 48 cl, 5 dwg
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