THERMOELECTRIC UNIT FOR CHECK OF THICKNESS OF LAYERS OF DOUBLE-LAYER CONDUCTING MATERIALS Russian patent published in 2004 - IPC

Abstract RU 2233441 C1

FIELD: measurement technology.

SUBSTANCE: proposed device is provided with thermal screen surrounding hot measuring thermal probe which is electrically insulated from it; thermal probe is provided with heater and is made in form of hollow thick-walled metal cylinder manufactured from high-conducting material for forming thermal field with isothermal surfaces; one surface coincides with interface of layers. Located in body of screen are additional heater and auxiliary thermal probe which is also electrically insulated from thermal screen.

EFFECT: reduction of measurement error due to thermal protection of measuring channel.

2 dwg

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RU 2 233 441 C1

Authors

Korndorf S.F.

Nogacheva T.I.

Uglova N.V.

Dates

2004-07-27—Published

2003-03-26—Filed