FIELD: testing facilities.
SUBSTANCE: invention can be used in developing new technologies of creation of designs of disks and rotors manufactured of different materials and for experimentally determining service life of disks and rotors of turbomachines. According to proposed method of thermal-cycle and blockage tests of turbomachine disks consisting of three stages, at first stage speed and temperature of disk is increased within the limits of test cycle, at second stage maximum preset values are maintained, and at third stage speed and temperature are reduced to minimum preset values using cooling air for this purpose, disk temperature is regulated by cooling air at second stage and at third stage surface of disk is additionally cooled from both sides by auxiliary cooling air. Prior to beginning of tests, cooling air and auxiliary cooling air are heated to preset temperature, minimum preset speed and different current frequency in hub and rim parts of disk are set. Prior to testing, temperature-sensitive plates are installed between rim lock surfaces of disks and surfaces of blade roots. Prior to testing, current frequency in disk rim part is set 4-6 times higher than current frequency in disk hub part. At third stage heat supply to disk hub part is stopped. At first stage disk speed is raised to 0.9 of maximum preset value and said speed is maintained and then is raised to maximum preset value. At third disk speed is reduced to 1.1 of minimum preset value and said speed is maintained and then reduced to minimum preset value. Prior to testing, equal minimum frequency of electric current in rim and hub parts of disk is set, at first stage current frequency is increased to maximum preset value, at second stage, frequency value is maintained, and at third stage current frequency is reduced to minimum preset value, current frequency in hub part of disk being kept constant at all three stages. At second stage maximum frequency of current is set 4-6 times higher than minimum preset value in rim part of disk.
EFFECT: reduced test periods, improved reliability, reduced power consumption for testing.
9 cl, 1 dwg
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Authors
Dates
2004-09-10—Published
2002-11-29—Filed