FIELD: measuring engineering.
SUBSTANCE: method includes obtaining voltage-current characteristics on a given area of the surface of a specimen to be investigated and determining the presence of defects of crystal structure from the voltage-current characteristic containing characteristic maximums.
EFFECT: excluded surface distraction.
2 cl, 6 dwg, 1 tbl
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Authors
Dates
2004-11-10—Published
2002-07-17—Filed