FIELD: nuclear power engineering; analyzing materials suffering radiation impact. SUBSTANCE: analyses are made by means of scanning probe microscope. Provision is made for analyzing various characteristics of surfaces by selecting adequate probe and its operating conditions. Analyses may be made both during radiation and after that. Results obtained are used to determine degree of radiation and dynamics of its impact on surface being analyzed. Device implementing proposed method has scanning probe microscope incorporating computer with control board and microscope measuring head. The latter has case with stops, coarse connection unit, electronic unit, and scanning unit with scanner, probe holder, and probe; it also has locking unit. Coarse connection unit has scanner safety stop. Electronic unit is provided with radiation shield. EFFECT: enlarged functional capabilities, enhanced inspecting and analyzing speed. 7 cl, 6 dwg
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Authors
Dates
2001-06-27—Published
2000-07-27—Filed