METHOD FOR CHECKING NON-UNIFORMITY OF FILM Russian patent published in 1997 - IPC

Abstract RU 2072587 C1

FIELD: electronic devices. SUBSTANCE: method involves use of tunnel microscope. In addition to direct voltage, alternating voltage is applied to junction sound-film-substrate. Film non-uniformity is judged by level of tunnel current. EFFECT: increased functional capabilities. 1 dwg

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RU 2 072 587 C1

Authors

Ivanov A.Ju.

Fedorov A.S.

Nevolin V.K.

Dates

1997-01-27Published

1993-07-15Filed