FIELD: electrical measurements.
SUBSTANCE: device is proposed for measurement of dielectric and magnetic permeability as well as thickness of spin coatings on surface of metal and can be used in chemical industry for inspecting composition and properties of liquid and solid media. Electro-magnetic field is induced in body of dielectric material to be inspected which material is applied onto dielectric substrate, by means of sequent excitation of slow surface waves: two E-waves are excited at different, but having almost the same value, wavelengths λr1 and λr2 and one H-wave having wavelength of λr3. Attenuation of field intensity is measured t normal plane in relation to direction of wave propagation by means of receiving vibrators system for different values of base d between them. Normal attenuation factors αE1,αE2 and αH are found from ratio of E(y)= E0 exp[-α(y) y]. Magnetic and dielectric permeability and thickness of magneto-dielectric coating are found from relations of 
and 
where 
has to be phase coefficient of H-wave.
EFFECT: improved precision of measurement.
1 dwg
