FIELD: metal processing.
SUBSTANCE: invention relates to electrophysical and geometrical parameters irregularities determining method of dielectric and non-magnetic coatings on metal surface and can be used for quality control of hard coatings on metal during development and operation of nonreflecting and absorbing coatings, as well as in chemical, paint and coatings and other industries. Said technical result is achieved by fact that in known UHF method of irregularities in dielectric coatings on metal substrate detecting, consisting in creation of slow surface E-wave electromagnetic field above dielectric coating on electrically conductive substrate, followed by recording changes in parameters, characterizing high-frequency field, in calculation of attenuation factor of α slow surface E-wave field intensity in normal plane relative to its propagation direction in spaced points and determining irregularities boundaries, preliminary measuring actual part of dielectric permeability ε′ and thickness b of reference sample coating, by which determining slow surface E-wave field intensity attenuation factor threshold value α0, wherein comparing in each measurement point of scanned coating surface current value of surface slow wave α field intensity attenuation factor with attenuation factor threshold value α0, and if α<α0, then making decision on presence of coating d delamination in given point.
EFFECT: technical result is higher probability of irregularities detecting due to determining of slow surface E-wave field intensity attenuation factor threshold value of with regard to analyzed coating individual characteristics.
1 cl, 1 dwg
