METHOD OF MEASURING LENGTH, THICKNESS AND DIELECTRIC CONSTANT OF DIELECTRIC COATING ON METAL SURFACE Russian patent published in 2005 - IPC

Abstract RU 2258214 C1

FIELD: measurement technology.

SUBSTANCE: microwave electromagnetic fields of running surface slow E-waves and E1 and E2 at two wavelengths λ_osc1 and λ_osc2 of oscillator being close in value above dielectric-metal surface at single-mode regime. Damping factors α_e1 and α_e2 of electric field strength are measured at normal plane relatively direction of propagation of slow surface of wave. Real value of dielectric constant and thickness of coating are calculated. Taking measured values of damping factors into account, values of deceleration are calculated for those wavelengths by relation of Directional pattern maximum angle of inclination θ_{dp max(fz)}=θ_e1(e2) is measured at far zone by means of vertically oriented receiving vibrator. Length of dielectric coating l_e1 and l_e2 is determined from relation of l_e1(e2)=0.552·λ_{osc e1(e2)}/(ν_{df e1(e2)}-cosθ_e1(e2) and its value l=(l_e1+l_e2)/2 is subject to averaging.

EFFECT: improved precision of measurement of longitudinal sizes of dielectric coating.

1 dwg

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RU 2 258 214 C1

Authors

Fedjunin P.A.

Dmitriev D.A.

Dates

2005-08-10—Published

2004-03-17—Filed