METHOD OF MEASURING LEVEL OF DIELECTRIC MATTER Russian patent published in 2005 - IPC

Abstract RU 2262669 C2

FIELD: electric measurement engineering.

SUBSTANCE: method can be used for measurement of electrical parameters of two-terminal networks used as detectors of physical processes (temperature, pressure, level of liquid and loose maters et cetera) at industrial installations, transportation vehicles and in systems for measuring level of setting-up of rocket-space equipment. Sinusoidal voltage is formed in capacitive level gauge and complex current is measured which passes through dry capacitive level gauge as well as through filled-in capacitive level gauge. Equivalent circuit of capacitive level gauge is specified which circuit consists of electric capacitance and active resistance. Sinusoidal voltage is formed in capacitive detector at two frequencies. After it complex current is measured through dry level detector and through reference detector for any of those frequencies. Results of measurement are registered, electric capacitance of capacitive level gauge is measured and registered and increment in electric capacitance of capacitive level gauge is measured and registered when submerging gauge into dielectric matter completely. Subsequent measurement and registration of complex current is carried out through capacitive level gauge filled with dielectric matter and through reference gauge for any of mentioned frequencies. For any periodical measurement the electric capacitance of capacitive level gauge is measured and registered. Relative filling of capacitive level gauge with dielectric matter is measured as difference of values of electric capacitance of dry capacitive level gauge and electric capacitance of filled-up capacitive level gauge related to increment in electric capacitance of capacitive level gauge submerged into liquid totally.

EFFECT: improved precision of measurement; improved adaptability to manufacture.

2 dwg

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RU 2 262 669 C2

Authors

Balakin S.V.

Dolgov B.K.

Dates

2005-10-20Published

2003-10-01Filed