FIELD: technology for measuring noises of semiconductor products.
SUBSTANCE: device contains preliminary amplifier, two independent channels, working in similar band of frequencies at different central frequencies, differential amplifier, logarithmic scale and device for automatic calibration of amplification, allowing automatic calibration of amplification coefficient of preliminary amplifier.
EFFECT: lower laboriousness of measurements.
1 dwg
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Authors
Dates
2007-02-27—Published
2005-11-01—Filed