DEVICE FOR MEASURING PARAMETER OF LOW FREQUENCY NOISE Russian patent published in 2007 - IPC G01R31/26 

Abstract RU 2294545 C1

FIELD: technology for measuring noises of semiconductor products.

SUBSTANCE: device contains preliminary amplifier, two independent channels, working in similar band of frequencies at different central frequencies, differential amplifier, logarithmic scale and device for automatic calibration of amplification, allowing automatic calibration of amplification coefficient of preliminary amplifier.

EFFECT: lower laboriousness of measurements.

1 dwg

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RU 2 294 545 C1

Authors

Gorlov Mitrofan Ivanovich

Smirnov Dmitrij Jur'Evich

Koz'Jakov Nikolaj Nikolaevich

Dates

2007-02-27Published

2005-11-01Filed