FIELD: technology for evaluating quality and reliability of semiconductor products at production stage and usage stage.
SUBSTANCE: in a batch of semiconductor products, intensity of low frequency noise is measured at two frequencies at nominal value of power voltage and similar value of noise measurement band width. Coefficient
is computed, where
and
- square efficient value of noise respectively at frequencies f1 and f2. Based on value of γ, batch of products is divided onto reliable and potentially unreliable.
EFFECT: increased efficiency.
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Authors
Dates
2007-10-27—Published
2005-06-01—Filed