FIELD: technology for evaluating quality and reliability of semiconductor products at production stage and usage stage.
SUBSTANCE: in a batch of semiconductor products, intensity of low frequency noise 
is measured at two frequencies at nominal value of power voltage and similar value of noise measurement band width. Coefficient 
is computed, where 
and 
- square efficient value of noise respectively at frequencies f1 and f2. Based on value of γ, batch of products is divided onto reliable and potentially unreliable.
EFFECT: increased efficiency.
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