FIELD: metal-film resistors for pressure, force, deformation, and strain-gage resistive sensors, and hybrid integrated circuits for radio and instrumentation industries.
SUBSTANCE: proposed method for regulating and adjusting thin-film resistors by means of voltage pulses of definite amplitude, length, and relative pulse duration includes their regulation and adjustment within single process cycle at constant amplitude, length, and relative pulse duration of voltage pulses. Regulation is conducted by means of voltage pulse bursts to low non-variable resistance which is recognized by means of checkup voltage pulse burst, whereupon resistor value is adjusted by applying voltage pulse bursts across these resistors; Number of voltage pulses in bursts is increased by several times and variations in resistor values are continuously checked at intervals between pulse bursts. Proposed device implementing this method has DC power supply, relay control unit of device, pulse shaper incorporating voltage pulse amplitude regulating component, and structured measurement control unit incorporating pulse counter, band switch, display time meter, NOR and AND gates, flip-flop, and also switching circuit. Provision is made for eliminating latent defects and for adjusting thin-film resistors within single process cycle at constant amplitude, length, and relative duration of voltage pulses while permanently checking resistor values.
EFFECT: simplified design, enlarged functional capabilities.
3 cl, 5 dwg, 2 ex
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Authors
Dates
2007-09-20—Published
2006-01-25—Filed