Show metadata Hide metadata

(19)

(11)

2 234 677

(13)

(51)

IPC

(21) (22)

Application

2002127427/28, 2002-10-14

(24)

Start date

2002-10-14

(22)

Actual filing date

2002-10-14

(45)

Published

2004-08-20

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Vladimirov L.V.Gusev V.E.Artem'Ev B.V.Volchkov Ju.E.Bojarintsev D.S.Vedernikov M.B.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija

SHEET ARTICLES THICKNESS X-RAY MEASUREMENT METHOD Russian patent published in 2004 - IPC

Abstract RU 2234677 C2

FIELD: nondestructive inspection procedure.

SUBSTANCE: method comes to recording X-rays passed through object under checking. Design peculiarity is successive two-fold detection of flow, determination of ratio of corresponding electric signals and determination of thickness of article by comparing obtained ratio of signals with graduated function.

EFFECT: improved sensitivity and increased accuracy of measurements.

1 dwg

Similar patents RU2234677C2

Title	Year	Author	Number
X-RAY METHOD OF ESTIMATION OF PARAMETERS OF COINAGE ALLOY SHEETS	2005	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Volchkov Jurij Evgen'Evich Artem'Ev Boris Viktorovich Mirosh Jurij Mikhajlovich Bobrov Aleksandr Petrovich	RU2280239C1
X-RAY METHOD FOR DETERMINATION OF PRODUCT PARAMETERS	2006	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Artem'Ev Boris Viktorovich Rolik Vladimir Andreevich Sozontov Aleksandr Aleksandrovich Evilin Grigorij Vasil'Evich	RU2312306C1
RADIATION METHOD OF INSPECTION OF ROLLED METAL'S THICKNESS	2004	Maslov A.I. Zapuskalov V.G. Artem'Ev B.V. Volchkov Ju.E.	RU2262663C1
DEVICE FOR X-RAY INSPECTION OF THICKNESS OF SHEET ITEMS	2004	Maslov A.I. Zapuskalov V.G. Artem'Ev B.V. Volchkov Ju.E. Gusev V.E.	RU2259538C1
METHOD OF X-RAY INSPECTION OF THICKNESS OF LAYERS OF TRIPLEX METAL BAND	2005	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Artem'Ev Boris Viktorovich Volchkov Jurij Evgen'Evich Sozontov Andrej Aleksandrovich	RU2285236C1
METHOD OF NENODESTRUCTIVE INSPECTION OF THICKNESS OF LAYERS OF BIMETAL BAND	2005	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Artem'Ev Boris Viktorovich Volchkov Jurij Evgen'Evich Mirosh Jurij Mikhajlovich Bobrov Aleksandr Petrovich	RU2281459C1
X-RAY THICKNESS GAUGE	2002	Maslov A.I. Zapuskalov V.G. Vladimirov L.V. Gusev E.A. Artem'Ev B.V. Volchkov Ju.E. Bojarintsev D.S. Ivanov D.P.	RU2215260C1
METHOD AND DEVICE FOR CHECKING AUTHENTICITY OF SEALED OBJECTS	2001	Gerts Kristof Tirauf Klaus	RU2268494C2
METHOD OF SMALL-ANGLE INTROSCOPY AND DEVICE FOR ITS REALIZATION ( VERSIONS )	1997	Komardin O.V. Lazarev P.I.	RU2137114C1
X-RAY METER OF PARAMETERS OF ROLLED PRODUCT	2002	Maslov A.I. Zapuskalov V.G. Artem'Ev B.V. Gusev V.E. Volchkov Ju.E. Bosamykin V.A. Bojarintsev D.S. Vedernikov M.B. Potapov V.N.	RU2221220C1

RU 2 234 677 C2

Authors

Maslov A.I.

Zapuskalov V.G.

Vladimirov L.V.

Gusev V.E.

Artem'Ev B.V.

Volchkov Ju.E.

Bojarintsev D.S.

Vedernikov M.B.

Dates

2004-08-20—Published

2002-10-14—Filed