METHOD OF X-RAY INSPECTION OF THICKNESS OF LAYERS OF TRIPLEX METAL BAND Russian patent published in 2006 - IPC G01B15/02 

FIELD: inspection and measuring technique.

SUBSTANCE: method of X-ray inspection can be used for measurement of thickness of layers of triplex (three-layers) metal band used for making sleeves for cartridges, projectiles etc. Inspected triplex band is subject to X-ray pulse radiation of first collimated and of second additional direct fluxes in antiphase at opposite surfaces of surfaces of band to meet each other. Both fluxes are subject to detection twice - before and after radiation. The fluxes are collimated by using cast with slits, oriented in parallel to each other along cross-section of band. Pulse X-ray radiation fluxes, radiated from material of band, are collimated and detected additionally. The fluxes are collimated to have shapes of slots oriented in parallel to each other along cross-section of the band. Detection is made by synchronous scanning of reflected radiation by angle covering aperture of collimated direct fluxes. Thickness of any layer of band is judged from detected signals.

EFFECT: widened functional abilities; high precision; high resolution of measurement of layer-by-layer thickness.

1 dwg