FIELD: microelectronics.
SUBSTANCE: proposed device that can be used for manufacturing semiconductor items and for analyzing causes of their failure at user's enabling action on open chip with ion stream formed at corona discharge upon their opening while saving contacts has base for mounting semiconductor item plate, enclosed chamber, corona discharge source, high-voltage power supply, regulating member, reference voltage supply, current take-off resistor (100 kΩ), voltmeter, semiconductor item technical data meter, probe handler, probe handler-to-probe coupling unit, pressure gage, and pump.
EFFECT: enhanced precision of diagnostics, enlarged functional capabilities.
1 cl, 1 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD FOR SORTING SEMICONDUCTOR PRODUCTS ON A BOARD | 2006 |
|
RU2316013C1 |
| METHOD FOR DETERMINING POTENTIALLY UNSTABLE SEMICONDUCTOR PRODUCTS ON A PLATE | 2006 |
|
RU2307369C1 |
| DEVICE FOR CHECKING CHARGE STABILITY OF SEMICONDUCTOR STRUCTURES | 0 |
|
SU1499631A1 |
| METHOD OF MEASURING TRANSIENT THERMAL CHARACTERISTICS OF SEMICONDUCTOR PRODUCTS | 2016 |
|
RU2639989C2 |
| COMBINED DEVICE FOR GRAVIMETRIC AND CHEMICAL ANALYSIS OF AEROSOLS | 2019 |
|
RU2706420C1 |
| METHOD OF CHECKING CHARGE STABILITY OF DIELECTRIC- SEMICONDUCTOR STRUCTURE WITH SURFACE JUNCTION | 0 |
|
SU1755218A1 |
| METHOD OF CHARGE CARRIER MOBILITY PROFILE DETERMINATION IN SEMICONDUCTOR LAYERS | 0 |
|
SU1775753A1 |
| DEVICE FOR CHECKING PERMISSIBLE VOLTAGE OF SKMICONDUCTOR DEVICES | 0 |
|
SU859973A1 |
| SPECIFIC OPTICAL SMOKE DENSITY METER | 2023 |
|
RU2809333C1 |
| DEVICE FOR MEASURING TRANSIT RESISTANCE OF CONTACTS OF HIGH-SPEED SYSTEMS | 0 |
|
SU580523A1 |
