METHOD FOR SORTING SEMICONDUCTOR PRODUCTS ON A BOARD Russian patent published in 2008 - IPC G01R31/26 

Abstract RU 2316013 C1

FIELD: microelectronics, possible use in technology for manufacturing semiconductor products, having p-n transitions, and also for analyzing products which failed at consumer side, allowing after opening with preservation of contacts to affect the open crystal with a stream of ions, generated during corona discharge.

SUBSTANCE: method for sorting semiconductor products on a board includes using effect of electric field, created by corona discharge, polarity of which corresponds to inversion of p-n transition, measuring current through dielectric, resulting from corona discharge. Also performed is measurement of volt-ampere characteristics or volt-farad characteristics, or ampere-noise characteristics at increased or decreased atmospheric pressure with currents flowing through dielectric, set on representative selection of semiconductor products; on basis of maximal spread of volt-ampere characteristics or volt-farad characteristics or ampere-noise characteristics, measured at values of current in dielectric from 10-7 to 10-4 A/cm2, determined respectively are standard volt-ampere characteristics or volt-farad characteristics or ampere-noise characteristics; and on basis of comparison between respectively measured volt-ampere characteristics or volt-farad characteristics or ampere-noise characteristics to standard ones the batch of semiconductor products is divided onto less reliable and reliable products.

EFFECT: increased precision of diagnostics and expanded functional capabilities of semiconductor product control on a board with usage of corona discharge.

Similar patents RU2316013C1

Title Year Author Number
METHOD FOR DETERMINING POTENTIALLY UNSTABLE SEMICONDUCTOR PRODUCTS ON A PLATE 2006
  • Gorlov Mitrofan Ivanovich
  • Zharkikh Aleksandr Petrovich
RU2307369C1
DEVICE FOR CHECKING SEMICONDUCTOR ITEMS FOR CHARGE STABILITY USING CORONA DISCHARGE 2006
  • Gorlov Mitrofan Ivanovich
  • Zharkikh Aleksandr Petrovich
RU2312424C1
METHOD OF MEASURING VOLTAGE-CURRENT AND VOLTAGE-CAPACITANCE CHARACTERISTICS (VERSIONS) 2012
  • Semenov Ehduard Valer'Evich
RU2498326C1
PHOTOSENSITIVE CELL 1991
  • Poljakov Vasilij Ivanovich
  • Ermakova Ol'Ga Nikolaevna
  • Ermakov Mikhail Georgievich
  • Elinson Vera Matveevna
  • Sleptsov Vladimir Vladimirovich
  • Ivanovskij Gennadij Fomich
  • Bobylev Aleksandr Vasil'Evich
RU2022410C1
METHOD FOR DETERMINING THE DEPTH DISTRIBUTION PROFILE OF MAJOR CHARGE CARRIER CONCENTRATION IN SEMICONDUCTOR HETEROSTRUCTURES 2023
  • Iakovlev Georgii Evgenevich
  • Zubkov Vasilii Ivanovich
  • Solomnikova Anna Vasilevna
RU2802862C1
SORTING OUT METHOD OF SEMI-CONDUCTING COMPONENTS 2008
  • Gorlov Mitrofan Ivanovich
  • Zharkikh Aleksandr Petrovich
RU2357263C1
METHOD FOR SORTING OUT SEMICONDUCTOR DEVICES 2003
  • Gorlov M.I.
  • Emel'Janov V.A.
  • Zharkikh A.P.
RU2253168C1
DEVICE TO MONITOR SEMICONDUCTOR PRODUCTS BY SECOND DERIVATIVES OF CURRENT-VOLTAGE AND VOLT-COULOMB CHARACTERISTICS 2011
  • Sazonov Sergej Nikolaevich
RU2460083C1
METHOD OF REINFORCEMENT ADDITIVE CONCENTRATION DETERMINATION IN SEMICONDUCTORS 2009
  • Grokhotkov Ivan Nikolaevich
  • Jafjasov Adil' Malikovich
  • Filatova Elena Olegovna
  • Bozhevol'Nov Vladislav Borisovich
RU2393584C1
METHOD FOR ELECTRICAL PASSIVATION OF SURFACE OF MONOCRYSTALLINE SILICON 2014
  • Stetsyura Svetlana Viktorovna
  • Kozlovskij Aleksandr Valerevich
  • Malyar Ivan Vladislavovich
RU2562991C2

RU 2 316 013 C1

Authors

Gorlov Mitrofan Ivanovich

Zharkikh Aleksandr Petrovich

Dates

2008-01-27Published

2006-04-25Filed