METHOD FOR PRODUCING PHOTOMASK BLANKS Russian patent published in 2008 - IPC G03F1/08 

Abstract RU 2319189 C2

FIELD: microelectronics; production of photomask blanks for integrated circuit manufacture.

SUBSTANCE: proposed method for manufacturing photomask blanks designed to produce photomasks followed by transferring microimage pattern onto semiconductor wafer involves introduction of oxidant in the form of gaseous halogen into carrier gas while applying ferric oxide masking layer using oxidizing pyrolysis of iron pentacarbonyl so as to stabilize this process and make it more complete.

EFFECT: enhanced yield of masking films free from defects; reduced process temperature.

4 cl, 1 tbl

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RU 2 319 189 C2

Authors

Nikitin Sergej Alekseevich

Dates

2008-03-10Published

2004-11-29Filed