DEVICE FOR MEASUREMENT OF COMPLEX PERMITTIVITY OF LOW- IMPEDANCE MATERIALS AT MICROWAVE FREQUENCIES Russian patent published in 2005 - IPC

Abstract RU 2247400 C1

FIELD: radio measurements of parameters of absorbing low-impedance dielectric materials at microwave frequencies, in particular, measur5ement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance.

SUBSTANCE: measurements are taken with the aid of a waveguide traveling-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality of resonance frequency, attenuation and quality factor.

EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance dielect6ric materials at microwave frequencies, having high values of complex permittivity .

2 cl, 1 dwg

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RU 2 247 400 C1

Authors

Dmitrienko G.V.

Trefilov N.A.

Dates

2005-02-27—Published

2004-01-20—Filed