DEVICE FOR MEASUREMENT OF HIGH VALUES OF COMPLEX PERMITTIVITY OF LOW-IMPEDANCE MATERIALS AT MICROWAVE FREQUENCIES Russian patent published in 2005 - IPC

Abstract RU 2247399 C1

FIELD: radio measurements of low-impedance dielectric materials at microwave frequencies, in particular, measurement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance.

SUBSTANCE: measurements are taken with the aid of a waveguide standing-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality factor.

EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance materials at microwave frequencies, having high values of complex permittivity .

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RU 2 247 399 C1

Authors

Dmitrienko G.V.

Trefilov N.A.

Dates

2005-02-27Published

2004-01-20Filed