DEVICE FOR MEASUREMENT OF MATERIAL PARAMETRES Russian patent published in 2009 - IPC G01R27/26 

FIELD: radio engineering.

SUBSTANCE: invention is related to the field of radio engineering and electronics and may be used both independently for measurement of electrophysical parametres of materials and as more complex functional devices: complex measurement systems, complex systems for production and control of material parametres, automated measurement, production and production-measurement complexes, etc. Device, according to invention, represents a rectangular wave guide with connected SHF generator, having shorting device 2, measurement device. Device comprises pin 3, installed in central part on one of wide walls of wave guide 1 parallel to shorting device 2. Height of pin h is less than size of wave guide b, so that between pin and other wide wall there is a gap. Shorting device 2 has a semicircular indent 4 on surface inverted inside wave guide, being parallel to pin along the whole width, and hole 5, probe in the form of needle 6 is coaxially installed in indent, being galvanically connected by means of connection loop 7 to shorting device 2, protruding beyond limits of wave guide 1. Distance from pin 3 to shorting device 2 and value of gap are selected on the basis of resonance appearance with low reflection ratio.

EFFECT: invention provides for simultaneous measurement of electrophysical material parametres: dielectric permeability in the range of 1,5÷400, conductivity in the range of 2·10^-2 Ohm^-1 ·m^-1÷10⁷ Ohm^-1·m^-1.

1 dwg, 1 tbl_, 1 ex