DEVICE FOR MEASURING TRANSVERSE DEFORMATION OF EASILY DEFORMED MATERIALS Russian patent published in 2008 - IPC G01B11/16 

FIELD: physics, measurements.

SUBSTANCE: invention pertains to the field of investigating properties of materials. The device consists of holding equipment and equipment for loading the sample, reading equipment and equipment for recording deformation values. The equipment for reading the deformation values is an optical-mechanical device and consists of a control pointer fitted with an infrared diode for controlling the width of the deformation sample. The pointer is made with provision for regulating its position relative the zero reading line. The pointer can be displaced through a threaded mechanical transmission. The position of the pointer is read by an optoelectronic linear displacement converter. Constant contact dynamic interaction of the control pointer with the surface of the sample provides for straightening the spiral edge formed. The equipment for recording values of transverse deformation consists of a microprocessor linked to the optical mechanical measuring system through an interface unit.

EFFECT: increased technological capabilities of investigating deformation properties of easily deformed materials and increased accuracy of measuring transverse deformation.

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