CONTROL OF ELECTROMECHANICAL BEHAVIOUR OF STRUCTURES IN DEVICE OF MICRO-ELECTROMECHANICAL SYSTEMS Russian patent published in 2009 - IPC H01L29/82 

Abstract RU 2348088 C2

FIELD: physics, optics.

SUBSTANCE: invention is related to thin-film structures in devices of micro-electromechanical systems and to electromechanical and optical responses of this thin-film structures. Device of micro-electromechanical systems (MEMS) comprises substrate, electrostatically displaced layer, electrode placed on substrate, air gap is located between electrode and displaced layer, layer of electric charges catching comprising material that is able to catch both positive and negative charges, transparent layer formed between layer of electric charges catching and electrode. Another two versions of MEMS device are also suggested, as well as two versions of MEMS manufacture.

EFFECT: provision of improved characteristic (electromechanical) response.

22 cl, 9 dwg

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RU 2 348 088 C2

Authors

Majls Mark V.

Bejti Dzhon

Chuj Klehrens

Kotari Manish

Dates

2009-02-27Published

2003-09-18Filed