FIELD: physics, computer engineering.
SUBSTANCE: invention relates to microelectromechanical systems of display devices. The apparatus comprises an array of interferometric modulators, a control circuit which transmits a signal through a first and a second electrode of one of the interferometric modulators, which changes the state of said modulator from a first state to a second state and back to the first state, a feedback circuit which measures electrical response of said modulator in response to the signal, a processor which controls a driver circuit, obtaining data characterising the measured response, and determining performance of the modulator based on the response, a storage device which interacts with the processor.
EFFECT: high efficiency of determining performance of a display device by measuring electrical response of said device in response to a signal transmitted through electrodes of said device.
27 cl, 27 dwg
