AUTOMATIC TEST SYSTEM Russian patent published in 2009 - IPC G05B23/02 H04B17/00 

FIELD: instrument engineering.

SUBSTANCE: invention concerns automatic communication checkout and test devices. The effect is ensured by that the automatic test system additionally comprises a data storage unit and an operation life evaluator, both carried out as a microprocessor digital signal processing system with an algorithm that specifies bit count values of measured response signal data flow from D0, D1 (n=1), where D0, D1 are signals of a bidirectional microprocessor data bus. The bit count values are recorded in the data storage unit registers. Thereafter, initial data are input from an LCU control through the data bus: n is a current bit count value, a represents a value that governs the system behaviour, R_j is a life value of product components, N is number of product components, T_u stands for usage duration over a period of communication application, T_o is latency period of communication application. The next stage involves calculation of average values , , , followed with calculation of resource K_u usage, communication operation life R_T. Then calculated R_t is compared to the reference value R_{t ref}. If matched, the required value R_t is specified with reading of values R_t through outputs D0, D1 of the digital signal processing system on the LCU control.

EFFECT: enhancement of the system.

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