FIELD: measuring engineering.
SUBSTANCE: invention refers to X-ray equipment. The method consists in the following: by calculation and before an experiment there is selected an optimal value of θ angle between velocity of fast electrons and direction of quantum escape whereat spectre of slowing-down radiation is concentrated in the region of low frequencies. Also position of maximum of coherent spike is measured experimentally. Additionally, position of this maximum as function of dimension and shape of grain is calculated theoretically. Notably, values of theoretical parametres are chosen to achieve the best concurrence of spectres of calculated and measured spikes.
EFFECT: evaluation of grain dimension in ultra-fine-dispersed medium (nano material).
2 dwg
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