METHOD OF MEASURING DISTRIBUTION OF COMPLEX REFRACTION INDEX VALUES OF HIGH-ABSORPTION SPECIMENS Russian patent published in 2010 - IPC G01N21/43 

FIELD: physics.

SUBSTANCE: specimen is placed on the flat surface of an attenuation total reflection (ATR) element with high refraction index. A beam of monochromatic radiation is transmitted to the boundary surface with divergence of not greater than 5 10^-2 rad and wavelength which is gradually adjusted in the entire wavelength range, with power which enables simultaneous detection of the entire section of the beam using a matrix radiation detector on which an image corresponding to the projection of the distribution of the local coefficient of reflection of radiation on the boundary surface is formed. Results of two separate measurements of the distribution of the reflection coefficient at two angles of incidence or at two radiation polarisations are processed on a computer using a program which calculates distribution of the complex refraction index on the surface of the analysed specimen using known Fresnel reflection laws and this distribution is displayed on a screen and stored in form of a file.

EFFECT: invention enables real time measurement in a wide wavelength range.

3 cl, 4 dwg