FIELD: physics.
SUBSTANCE: non-contact profile measuring device has an illumination circuit which forms a probing line of light on an object, a CCD matrix, a dual-channel receiving projector circuit and a computing unit. The dual-channel receiving projector circuit constructs two images of points of the object on the plane of the CCD matrix and has a pentaprism whose optical axes lie on the base to apex, telescopic systems with a collecting lens in the plane of the primary image of the object and a connector assembly. The connector assembly directs light flux of two channels on the projection anamorphic lens which consists of two cylindrical focusing elements with orthogonal focusing planes and superimposed image planes. The telescopic systems can be made from cylindrical focusing elements. Anamorphic units enable equalisation of sensitivity on transverse and longitudinal coordinates.
EFFECT: more accurate measurement at large distances from the object, wider range of measurements on the transverse coordinate and smaller dimensions of the device.
2 cl, 3 dwg
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Authors
Dates
2010-09-10—Published
2008-09-17—Filed