FIELD: electricity.
SUBSTANCE: invention relates to method and device for testing of semi-conductor plates (5) with the help of clamping accessory (1) with controlled setting of temperature. At the same time during realisation of proposed method with the help of proposed device, conditions are provided, when capacity of heating is much higher than specified testing capacity. At the same time in process of testing fluid temperature increase, which reflects testing power, is registered. And capacity of heating is reduced during test under substantially constant capacity of cooling, taking into account fluid temperature increase measured during testing.
EFFECT: creation of method and device for testing of semi-conductor plates, which provide for possibility to train semi-conductor plates.
12 cl, 2 dwg
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