FIELD: physics, instrument-making.
SUBSTANCE: invention relates to electronics and is used to set temperature of integrated microcircuits when testing for resistance to effect of heavy charged particles in vacuum chambers. The apparatus includes a heat-conducting plate for placing a printed-circuit board with a test object, two thermoelectric modules, a cooling unit and two temperature sensors, one of which is placed on the heat-conducting plate, a control unit connected to the modules, temperature sensors and cooling unit. The cooling unit comprises a radiator with fans and a water unit, connected by pipelines through a pump to the radiator. The first and second thermoelectric modules are installed in series between the heat-conducting plate and the water unit. The pipelines are equipped with quick-disconnect airtight valves. The second temperature sensor is placed on the surface of the water unit on the side of the second thermoelectric module.
EFFECT: invention widens the operating temperature range radiation tests of integrated microcircuits, reduces the cost of testing microcircuits due to lower time costs.
3 cl, 2 dwg, 2 tbl, 1 ex
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Authors
Dates
2017-02-07—Published
2015-12-18—Filed