FIELD: physics.
SUBSTANCE: in the method, the analysed material placed on a black substrate is illuminated normal to the surface. A flat metallic mirror is placed under the analysed material as another substrate. After detecting relative reflected light flux, the coefficient of reflection of light by material placed on the black substrate Ro and the coefficient of reflection of light by material placed on the flat metallic mirror Rm is determined. Transparency dc of the analysed material is determined by the value 
EFFECT: high accuracy of determining coefficient of reflection owing to elimination of uncertainty of obtained results.
2 dwg, 2 tbl
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