METHOD FOR CREATING REFERENCE GAGES FOR NON-DESTRUCTIVE SPECTRAL METHODS OF MEASURING IMPURITY CONCENTRATION IN CRYSTALS Russian patent published in 2012 - IPC G01N21/63 

Abstract RU 2442143 C1

FIELD: chemistry.

SUBSTANCE: according to the method, the roentgenofluorescence intensity of the analytic line is measured in the tested sample (crystal) and the roentgenofluorescence intensity of the same line is measured in working mixture containing a known amount of the measured element. A calibration chart is built and the absolute concentration of the impurities in the sample. At the same time spectral measurements of the sample are carried out, their results are compared with the results of roentgenofluorescence measurement and a reference gage is acquired for future use in impurity spectral analysis in industrial-scale production of the crystals.

EFFECT: creation of reference gages (reference crystal samples) while retaining measurement accuracy for controlled crystal properties.

4 dwg

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RU 2 442 143 C1

Authors

Semashko Vadim Vladimirovich

Korableva Stella Leonidovna

Naumov Aleksandr Kondrat'Evich

Marisov Mikhail Aleksandrovich

Dates

2012-02-10Published

2010-07-19Filed