FIELD: chemistry.
SUBSTANCE: in order to obtain a nanosized thin-film standard sample of a chemical composition of an inorganic substance or material by spark source mass spectrometry, successive removal of nanolayers of the sample and determination of the thickness and chemical composition of each removed layer before formation of the nanolayer whose chemical composition is identical to the chemical composition of the previous removed nanolayer is carried out; that chemical composition of the nanolayer is metrologically certified and the surface nanolayer formed is used as a thin-film standard sample of nanomaterial for calibrating devices and checking accuracy of chemical analysis.
EFFECT: invention enables to obtain a standard thin-film sample which can be used for quantitative measurement of impurity composition of different nanosized films.
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Authors
Dates
2013-05-27—Published
2011-12-06—Filed