SYSTEM FOR MEASURING CHARACTERISTICS OF OPTOELECTRONIC DEVICES Russian patent published in 2013 - IPC G01M11/02 G03B43/00 H04N17/00 

FIELD: physics.

SUBSTANCE: system has an illuminator, a test object, spatially spaced apart light-sensitive sensors mounted in the plane of the test object and connected to an illumination control device which is connected to the illuminator. The test optoelectronic camera device is connected to a data processing system which is connected to the illumination control device. The object plane of the lens of the test optoelectronic camera device coincides with the plane of the test object. The illumination control device is configured to vary the level of illumination of the test object and control its uniformity by sending a corresponding control signal to the illuminator, correcting the control signal in accordance with a feedback signal from the light-sensitive sensors and measuring the real steady-state value of the level of illumination of the test object. The test device captures an image of the test object and transmits the captured data to the data processing system which determines characteristics of the test device based on the captured data and values of the level of illumination of the test object.

EFFECT: high accuracy of measurements through accurate adjustment of illumination of the test object.

13 cl, 1 dwg