SYSTEM FOR FUNCTIONAL TESTING HOUSED RANDOM-ACCESS MEMORY MICROCIRCUIT CHIPS Russian patent published in 2011 - IPC G06F11/26 G01R31/28 

FIELD: information technology.

SUBSTANCE: system has a microcontroller with built-in flash memory and two analogue-to-digital converters (ADC), a USB to UART converter, a 100 MHz generator, a microcontroller temperature sensor, 1.7 V, 2.5 V, 3.3 V and 5.0 V power supplies, a power supply selector unit, a unit for measuring current consumption, a unit for checking contact of leads of the tested RAM microcircuit chips, a converter for converting the voltage level of control input of the tested RAM microcircuit chips, a converter for converting the voltage level of the address bus of the tested RAM microcircuit chips, a personal computer (PC), a power supply, a driver, a comparator, a load for each of the n data bus lines of the tested RAM microcircuit chips, m digital temperature sensors for the RAM microcircuit chips mounted on the housing of the tested RAM microcircuit chips.

EFFECT: full functional testing of high-capacity microcircuits, possibility of inspecting several RAM microcircuit chips simultaneously, shorter testing time, cheap design and low power consumption.

3 dwg